Atomic Force Microscopy (AFM) Laboratory
Some introductory text.
Atomic Force Microscopy (AFM) laboratory room
Equipment
Bruker Dimension AFM (left) and Bruker Multimode 8 AFM (right)
Scanning-probe AFM with low noise and high-bandwidth photo-detector read-out circuit
Generic equipment
- Oscilloscopes
- Keysight DSO-X-2004A (3)
- Tektronix DDS2012 (2)
- Tektronix TDS6644A (1)
- Function generators
- Stanford Research Systems DS335 (1)
- Krohn Hite 5900C (1)
- Filters
- Wavetek Brickwall 753A (1)
- Power supplies
- Agilent U8001 (1)
- Lock-in amplifiers
- Stanford Research Systems SR844 (1)
- Ametek 7270DSP (1)
- System analyzers
- HP 4395A (1)
- HP 54620A (1)
- Piezo amplifiers
- Falco Systems WMA300 (3)
- Passive vibration isolation systems
- Thorlabs optical tables (2)
- Active vibration isolation systems
- Accurion halcyonics Nano 20/30 desktop unit (1)
Sensors and actuators
- Capacitive displacement sensor
- MicroSense 6810 (2)
- Piezoelectric stack actuator
- Noliac (>30)
High-end equipment
- Atomic force microscopes (AFM) with controller and Signal Access Module (SAM)
- Bruker Multimode 5 (1)
- Bruker Multimode 8 (1)
- Bruker Dimension (1)
- Optical microscopes
- Zeiss Axio (1)
- Sample and probes for mechanical, electrical and magnetic measurements (>1000)
Self-built equipment
- Viceo-rate AFM with controller and high-bandwidth piezo-amplifier (1)
- Scanning-lever AFM with low-noise, high-bandwidth photo-detector read-out circuit (1)
- Cantilever holder for piezoresistive AFM cantilever beam (1)