2022
- N. Berlakovich, M. Fuerst, E. Csencsics, and G. Schitter, Reconstruction of optical wavefronts with parallel registration algorithms, in Optical Manufacturing and Testing XIV, 2022, p. 192–198.
[BibTex] [Download]@inproceedings{berlakovich2022reconstruction, title={Reconstruction of optical wavefronts with parallel registration algorithms}, author={Berlakovich, Nikolaus and Fuerst, Martin and Csencsics, Ernst and Schitter, Georg}, booktitle={Optical Manufacturing and Testing XIV}, volume={12221}, pages={192--198}, year={2022}, organization={SPIE}, doi={https://doi.org/10.1117/12.2632961}, } - C. Haider, M. E. Fuerst, M. Laimer, E. Csencsics, and G. Schitter, Range-Extended Confocal Chromatic Sensor System for Double-Sided Measurement of Optical Components With High Lateral Resolution, IEEE Transactions on Instrumentation and Measurement, vol. 71, pp. 1-8, 2022.
[BibTex] [Download]@Article{haider2022TIM, author={Haider, Christian and Fuerst, Martin E. and Laimer, Matthias and Csencsics, Ernst and Schitter, Georg}, journal={IEEE Transactions on Instrumentation and Measurement}, title={Range-Extended Confocal Chromatic Sensor System for Double-Sided Measurement of Optical Components With High Lateral Resolution}, year={2022}, volume={71}, number={}, pages={1-8}, doi={10.1109/TIM.2022.3216679}, } - N. Berlakovich, M. Fuerst, E. Csencsics, and G. Schitter, Improving the precision of parallel registration by incorporating a priori information, Optics Express, vol. 30, iss. 23, p. 41473–41491, 2022.
[BibTex] [Download]@article{berlakovich2022improving, title={Improving the precision of parallel registration by incorporating a priori information}, author={Berlakovich, Nikolaus and Fuerst, Martin and Csencsics, Ernst and Schitter, Georg}, journal={Optics Express}, volume={30}, number={23}, pages={41473--41491}, year={2022}, publisher={Optica Publishing Group}, doi={https://doi.org/10.1364/OE.469299}, }
2021
- M. Fuerst, E. Csencsics, N. Berlakovich, and G. Schitter, Automated Measurement of Highly Divergent Optical Wavefronts with a Scanning Shack-Hartmann Sensor, IEEE Transactions on Instrumentation and Measurement, vol. 70, 2021.
[BibTex] [Download]@article{TUW-291040, author = {Fuerst, Martin and Csencsics, Ernst and Berlakovich, Nikolaus and Schitter, Georg}, title = {Automated Measurement of Highly Divergent Optical Wavefronts with a Scanning Shack-Hartmann Sensor}, journal = {IEEE Transactions on Instrumentation and Measurement}, year = {2021}, volume = {70}, numpages = {9}, doi = {10.1109/TIM.2020.3038002}, keywords = {Shack-Hartmann wavefront sensor, Dynamic range extension, Optical metrology, Automatic optical inspection, Quality management, Error Budgeting} } - N. Berlakovich, M. Fuerst, E. Csencsics, and G. Schitter, Robust wavefront segment registration based on a parallel approach, Applied Optics, vol. 60, iss. 6, p. 1578–1586, 2021.
[BibTex] [Download]@article{TUW-295213, author = {Berlakovich, Nikolaus and Fuerst, Martin and Csencsics, Ernst and Schitter, Georg}, title = {Robust wavefront segment registration based on a parallel approach}, journal = {Applied Optics}, year = {2021}, volume = {60}, number = {6}, pages = {1578--1586}, doi = {10.1364/AO.413207} } - N. Berlakovich, E. Csencsics, M. Fuerst, and G. Schitter, Fast, precise and shape-flexible registration of wavefronts, Applied Optics, vol. 60, iss. 23, p. 6781–6790, 2021.
[BibTex] [Download]@article{TUW-296824, author = {Berlakovich, Nikolaus and Csencsics, Ernst and Fuerst, Martin and Schitter, Georg}, title = {Fast, precise and shape-flexible registration of wavefronts}, journal = {Applied Optics}, year = {2021}, volume = {60}, number = {23}, pages = {6781--6790}, doi = {10.1364/AO.425493}, keywords = {Algorithms; Metrology; Phase measurement; Testing; Optical sensing and sensors} } - N. Berlakovich, E. Csencsics, M. Fuerst, and G. Schitter, Iterative parallel registration of strongly misaligned wavefront segments, Optics Express, vol. 29, iss. 21, p. 33281–33296, 2021.
[BibTex] [Download]@article{TUW-299489, author = {Berlakovich, Nikolaus and Csencsics, Ernst and Fuerst, Martin and Schitter, Georg}, title = {Iterative parallel registration of strongly misaligned wavefront segments}, journal = {Optics Express}, year = {2021}, volume = {29}, number = {21}, pages = {33281--33296}, doi = {10.1364/OE.438350} }
2020
- M. Fuerst, C. Haider, E. Csencsics, and G. Schitter, Confocal chromatic sensor with actively tilted lens for 3D measurement, Journal of the Optical Society of America A, vol. 37, iss. 9, p. 46–52, 2020.
[BibTex] [Download]@article{TUW-289907, author = {Fuerst, Martin and Haider, Christian and Csencsics, Ernst and Schitter, Georg}, title = {Confocal chromatic sensor with actively tilted lens for 3D measurement}, journal = {Journal of the Optical Society of America A}, year = {2020}, volume = {37}, number = {9}, pages = {46--52}, doi = {10.1364/JOSAA.394212} } - M. Fuerst, N. Berlakovich, E. Csencsics, and G. Schitter, Self-Aligning Scanning Shack-Hartmann Sensor for Automatic Wavefront Measurements of High-NA Optics, in Proceedings of the IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2020), 2020.
[BibTex] [Download]@inproceedings{TUW-289906, author = {Fuerst, Martin and Berlakovich, Nikolaus and Csencsics, Ernst and Schitter, Georg}, title = {Self-Aligning Scanning Shack-Hartmann Sensor for Automatic Wavefront Measurements of High-NA Optics}, booktitle = {Proceedings of the IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2020)}, year = {2020}, numpages = {6}, doi = {10.1109/I2MTC43012.2020.9128499}, keywords = {Shack-Hartmann wavefront sensor, Dynamic range extension, Optical metrology, Automatic optical inspection, Quality management}, note = {Vortrag: IEEE International Instrumentation and Measurement Technology Conference Proceedings I2MTC (2020), Dubrovnik, Kroatien; 2020-05-25 -- 2020-05-28} }
2019
- M. Fuerst and G. Schitter, Scanning Wavefront Sensor for Measurement of Highly Divergent Wavefronts, in Proceedings of the Joint Conference 8th IFAC Symposium on Mechatronic Systems (MECHATRONICS 2019), and 11th IFAC Symposium on Nonlinear Control Systems (NOLCOS 2019), 2019.
[BibTex] [Download]@inproceedings{TUW-281663, author = {Fuerst, Martin and Schitter, Georg}, title = {Scanning Wavefront Sensor for Measurement of Highly Divergent Wavefronts}, booktitle = {Proceedings of the Joint Conference 8th IFAC Symposium on Mechatronic Systems (MECHATRONICS 2019), and 11th IFAC Symposium on Nonlinear Control Systems (NOLCOS 2019)}, year = {2019}, journal = {IFAC-PapersOnLine/Elsevier}, volume = {52/15}, numpages = {6}, doi = {10.1016/j.ifacol.2019.11.644}, keywords = {Freeform optics, optical metrology, wavefront measurement, scanning system, Shack-Hartmann sensor, surface metrology}, note = {Vortrag: Joint Conference 8th IFAC Symposium on Mechatronic Systems (MECHATRONICS 2019), and 11th IFAC Symposium on Nonlinear Control Systems (NOLCOS 2019), Wien; 2019-09-04 -- 2019-09-06} }
2018
- M. Fuerst, S. Unger, S. Ito, and G. Schitter, Wavefront measurement based feedback control for automatic alignment of a high-NA optical system, Journal of Physics: Conference Series, vol. 1065, 2018.
[BibTex] [Download]@article{TUW-273524, author = {Fuerst, Martin and Unger, Severin and Ito, Shingo and Schitter, Georg}, title = {Wavefront measurement based feedback control for automatic alignment of a high-NA optical system}, journal = {Journal of Physics: Conference Series}, year = {2018}, volume = {1065}, numpages = {4}, doi = {10.1088/1742-6596/1065/3/032001} } - M. Fuerst, S. Unger, S. Ito, and G. Schitter, Wavefront measurement based feedback control for automatic alignment of a high-NA optical system, in XXII World Congress of the International Measurement Confederation (IMEKO), 2018.
[BibTex] [Download]@inproceedings{TUW-271223, author = {Fuerst, Martin and Unger, Severin and Ito, Shingo and Schitter, Georg}, title = {Wavefront measurement based feedback control for automatic alignment of a high-NA optical system}, booktitle = {XXII World Congress of the International Measurement Confederation (IMEKO)}, year = {2018}, numpages = {4}, note = {Vortrag: XXII World Congress of the International Measurement Confederation (IMEKO), Belfast (UK); 2018-09-03 -- 2018-09-06} }
2017
- E. Csencsics, S. Ito, M. Fuerst, F. Cigarini, and G. Schitter, Christian Doppler Laboratory Precision Engineering for Automated In-line Metrology, in 1st GMAR workshop, 2017.
[BibTex]@Conference{TUW-0612172, author = {Csencsics, E. and Ito, S. and Fuerst, M. and Cigarini, F. and Schitter, G.}, title = {Christian Doppler Laboratory Precision Engineering for Automated In-line Metrology}, booktitle = {1st GMAR workshop}, year = {2017} }
2014
- M. Brameshuber, C. Manner, M. Fuerst, E. Sevcsik, and G. J. Schuetz, “Direct Imaging of Mobile Nanodomains in the Live Cell Plasma Membrane by using a Two-Color Photobleaching Approach,” Biophysical Journal, vol. 106, no. 2, p. 511a, Jan. 2014.