Nikolaus Berlakovich
Dipl.-Ing. BSc

Room: CA0418
Tel.: +43 (0) 1 58801 376 529
E-mail: berlakovich@acin.tuwien.ac.at
ORCID iD: 0000-0003-4431-7272
Short Curriculum Vitae


2022

  • D. Wertjanz, N. Berlakovich, E. Csencsics, and G. Schitter, Range extension of a scanning confocal chromatic sensor for precise robotic inline 3D measurements, in 2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), 2022, pp. 1-6.
    [BibTex] [Download]
    @inproceedings{wertjanzI2MTC2022,
    author={Wertjanz, Daniel and Berlakovich, Nikolaus and Csencsics, Ernst and Schitter, Georg},
    booktitle={2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)},
    title={Range extension of a scanning confocal chromatic sensor for precise robotic inline 3D measurements},
    year={2022},
    volume={},
    number={},
    pages={1-6},
    doi={10.1109/I2MTC48687.2022.9806615},
    pdfurl = {https://www.acin.tuwien.ac.at/file/publications/iat/pre_post_print/wertjanzI2MTC2022.pdf}}
  • N. Berlakovich, M. Fuerst, E. Csencsics, and G. Schitter, Reconstruction of optical wavefronts with parallel registration algorithms, in Optical Manufacturing and Testing XIV, 2022, p. 192–198.
    [BibTex] [Download]
    @inproceedings{berlakovich2022reconstruction,
    title={Reconstruction of optical wavefronts with parallel registration algorithms},
    author={Berlakovich, Nikolaus and Fuerst, Martin and Csencsics, Ernst and Schitter, Georg},
    booktitle={Optical Manufacturing and Testing XIV},
    volume={12221},
    pages={192--198},
    year={2022},
    organization={SPIE},
    doi={https://doi.org/10.1117/12.2632961},
    }
  • N. Berlakovich, M. Fuerst, E. Csencsics, and G. Schitter, Improving the precision of parallel registration by incorporating a priori information, Optics Express, vol. 30, iss. 23, p. 41473–41491, 2022.
    [BibTex] [Download]
    @article{berlakovich2022improving,
    title={Improving the precision of parallel registration by incorporating a priori information},
    author={Berlakovich, Nikolaus and Fuerst, Martin and Csencsics, Ernst and Schitter, Georg},
    journal={Optics Express},
    volume={30},
    number={23},
    pages={41473--41491},
    year={2022},
    publisher={Optica Publishing Group},
    doi={https://doi.org/10.1364/OE.469299},
    }
  • M. E. Fürst, N. Berlakovich, E. Csencsics, and G. Schitter, Scanning Shack-Hartmann sensor for wavefront measurements on freeform optics, in Proc. SPIE 12221, Optical Manufacturing and Testing XIV, 122210T, 2022.
    [BibTex] [Download]
    @InProceedings{fuerst_2022_SPIE,
    author = {M. E. Fürst and N. Berlakovich and E. Csencsics and G. Schitter},
    booktitle = {Proc. SPIE 12221, Optical Manufacturing and Testing XIV, 122210T},
    title = {Scanning Shack-Hartmann sensor for wavefront measurements on freeform optics},
    year = {2022},
    doi = {10.1117/12.2628328},
    }

2021

  • M. Fuerst, E. Csencsics, N. Berlakovich, and G. Schitter, Automated Measurement of Highly Divergent Optical Wavefronts with a Scanning Shack-Hartmann Sensor, IEEE Transactions on Instrumentation and Measurement, vol. 70, 2021.
    [BibTex] [Download]
    @article{TUW-291040,
    author = {Fuerst, Martin and Csencsics, Ernst and Berlakovich, Nikolaus and Schitter, Georg},
    title = {Automated Measurement of Highly Divergent Optical Wavefronts with a Scanning Shack-Hartmann Sensor},
    journal = {IEEE Transactions on Instrumentation and Measurement},
    year = {2021},
    volume = {70},
    numpages = {9},
    doi = {10.1109/TIM.2020.3038002},
    keywords = {Shack-Hartmann wavefront sensor, Dynamic range extension, Optical metrology, Automatic optical inspection, Quality management, Error Budgeting}
    }
  • N. Berlakovich, M. Fuerst, E. Csencsics, and G. Schitter, Robust wavefront segment registration based on a parallel approach, Applied Optics, vol. 60, iss. 6, p. 1578–1586, 2021.
    [BibTex] [Download]
    @article{TUW-295213,
    author = {Berlakovich, Nikolaus and Fuerst, Martin and Csencsics, Ernst and Schitter, Georg},
    title = {Robust wavefront segment registration based on a parallel approach},
    journal = {Applied Optics},
    year = {2021},
    volume = {60},
    number = {6},
    pages = {1578--1586},
    doi = {10.1364/AO.413207}
    }
  • N. Berlakovich, E. Csencsics, M. Fuerst, and G. Schitter, Fast, precise and shape-flexible registration of wavefronts, Applied Optics, vol. 60, iss. 23, p. 6781–6790, 2021.
    [BibTex] [Download]
    @article{TUW-296824,
    author = {Berlakovich, Nikolaus and Csencsics, Ernst and Fuerst, Martin and Schitter, Georg},
    title = {Fast, precise and shape-flexible registration of wavefronts},
    journal = {Applied Optics},
    year = {2021},
    volume = {60},
    number = {23},
    pages = {6781--6790},
    doi = {10.1364/AO.425493},
    keywords = {Algorithms; Metrology; Phase measurement; Testing; Optical sensing and sensors}
    }
  • N. Berlakovich, E. Csencsics, M. Fuerst, and G. Schitter, Iterative parallel registration of strongly misaligned wavefront segments, Optics Express, vol. 29, iss. 21, p. 33281–33296, 2021.
    [BibTex] [Download]
    @article{TUW-299489,
    author = {Berlakovich, Nikolaus and Csencsics, Ernst and Fuerst, Martin and Schitter, Georg},
    title = {Iterative parallel registration of strongly misaligned wavefront segments},
    journal = {Optics Express},
    year = {2021},
    volume = {29},
    number = {21},
    pages = {33281--33296},
    doi = {10.1364/OE.438350}
    }

2020

  • M. Fuerst, N. Berlakovich, E. Csencsics, and G. Schitter, Self-Aligning Scanning Shack-Hartmann Sensor for Automatic Wavefront Measurements of High-NA Optics, in Proceedings of the IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2020), 2020.
    [BibTex] [Download]
    @inproceedings{TUW-289906,
    author = {Fuerst, Martin and Berlakovich, Nikolaus and Csencsics, Ernst and Schitter, Georg},
    title = {Self-Aligning Scanning Shack-Hartmann Sensor for Automatic Wavefront Measurements of High-NA Optics},
    booktitle = {Proceedings of the IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2020)},
    year = {2020},
    numpages = {6},
    doi = {10.1109/I2MTC43012.2020.9128499},
    keywords = {Shack-Hartmann wavefront sensor, Dynamic range extension, Optical metrology, Automatic optical inspection, Quality management},
    note = {Vortrag: IEEE International Instrumentation and Measurement Technology Conference Proceedings I2MTC (2020), Dubrovnik, Kroatien; 2020-05-25 -- 2020-05-28}
    }