High resolution long range Lidar for autonomous driving (LiDcAR)

Lidar is an acronym for light detection and ranging, in analogy to radar. Lidar has received much attention in the automotive industry as a key component for high level automated driving systems. Compared to other sensing techniques such as stereo cameras and radar, lidar can provide high resolution and highly accurate 3D measurements of the surroundings and robust detection in various weather conditions. Weiterlesen →

TracSat

The precise tracking of high velocity satellites with ground based optical telescopes is a prerequisite for a number of future applications such as optical satellite communication, observation of space debris or satellite laser ranging. To achieve this goal, good mechatronic design as well as high performance control are necessary. Together with our industrial partner, ASA Astrosysteme GmbH, this project aims on increasing the achievable precision and tracking velocity of existing ASA ground stations. Weiterlesen →

Fundamentals of opto-mechatronic systems (OMC)

Currently innovation is taking place at the border of disciplines rather than in one individual field of engineering. This particularly holds for application domains that span more than one field of engineering, since a high level of system integration from different disciplines provides solutions that a single domain alone cannot provide. As an example, the combination of optics and mechatronics form the interdisciplinary field of opto-mechatronics. Weiterlesen →

Characterization of highly divergent optics (DOC)

Opto-mechatronic devices such as triangulation sensors or chromatic confocal sensors project focused light beams onto the surface of the measuring object. Assessing the properties of the focused beam is essential as they are directly related to the achievable measurement resolution and precision of the opto-mechatronic device. Weiterlesen →

Atomic Force Microscopy capable of vibration isolation (Vibrostop AFM)

An atomic force microscope (AFM) can image and inspect a sample surface with high resolution by scanning a probe with a sharp tip over the sample. During scanning, the vertical position of the probe with respect to the sample typically needs to be regulated with nanometer resolution. For the required high resolution, AFMs are sensitive to vibrations transmitted from the floor dependent on their design. Weiterlesen →

Automated in-line metrology for nanopositioning systems (aim4np)

Robot based in-process metrology is a key enabling technology for upcoming production systems and is considered as one of the most important preconditions for future production. Measuring properties at the nanometer scale such as topography, morphology and roughness within a production line becomes increasingly important for quality control and process monitoring tasks to make high tech production more efficient. Weiterlesen →