High-precision electrical AFM modes for biological applications2016 - 2018
Electrical modes of Atomic Force Microscopy (AFM) allow the high-resolution mapping of surface charges on a sample with nanometer precision. A particular measurement challenge is to perform such modes on biological samples (tissue extracts, biomolecules, biomembranes, etc). To this end, the project aims to investigate different preparation and measurement approaches and a specific goal is to determine alterations of surface charge of biological fibers caused by the reaction with sugar, which has important implications in medicine and cell biology. Read more →
High resolution long range Lidar for autonomous driving (LiDcAR)2017 - 2020
Lidar is an acronym for light detection and ranging, in analogy to radar. Lidar has received much attention in the automotive industry as a key component for high level automated driving systems. Compared to other sensing techniques such as stereo cameras and radar, lidar can provide high resolution and highly accurate 3D measurements of the surroundings and robust detection in various weather conditions. Read more →
SatComScope2016 - 2019
This project aims to integrate adaptive optics (AO) technology into small-sized telescope systems of the industrial partner, ASA Astrosysteme, in order to enable free space optical (FSO) communication between satellites and optical ground stations. Compared to radio-frequency communication, this yields a potential increase of the data rate of more than 1 order of magnitude, while simultaneously significantly reducing the emitting power and weight on the satellite. Read more →
TracSat
The precise tracking of high velocity satellites with ground based optical telescopes is a prerequisite for a number of future applications such as optical satellite communication, observation of space debris or satellite laser ranging. To achieve this goal, good mechatronic design as well as high performance control are necessary. Together with our industrial partner, ASA Astrosysteme GmbH, this project aims on increasing the achievable precision and tracking velocity of existing ASA ground stations. Read more →
IQ AFM
Imaging, handling and manipulation of material with high resolution are important techniques for various applications of research. Atomic force microscopes (AFM) are one of the most important tools for imaging applications with spatial resolution beyond the diffraction limit of light. The project aims is to build a basic AFM-system in cooperation with Anton Paar GmbH. Read more →
Scanning optical point- and line-sensor (SOS)
To overcome the limitation for better productivity and reliability of production in this project, a rotating or steering mirror scans the sensor’s optical point or line over a product surface, targeting triangulation, confocal, and color sensors. Read more →
Characterization of highly divergent optics (DOC)
Opto-mechatronic devices such as triangulation sensors or polychromatic confocal sensors project focused light beams onto the surface of the measuring object. Assessing the properties of the focused beam is essential as they are directly related to the achievable measurement resolution and precision of the opto-mechatronic device. Read more →
Atomic Force Microscopy capable of vibration isolation (Vibrostop AFM)
An atomic force microscope (AFM) can image and inspect a sample surface with high resolution by scanning a probe with a sharp tip over the sample. During scanning, the vertical position of the probe with respect to the sample typically needs to be regulated with nanometer resolution. For the required high resolution, AFMs are sensitive to vibrations transmitted from the floor dependent on their design. Read more →
Automated in-line metrology for nanopositioning systems (aim4np)
Within the scope of this project, a novel approach is developed for robot-based in-line metrology to isolate nanoscale measurements from environmental vibrations. Instead of isolating sample and robot from floor vibrations by means of passive or active vibration isolation aids, the distance between sample and metrology tool is kept constant. Read more →